Testing embedded analogue functions in mixed analogue/digital circuits poses a number of problems, particularly the application of the input test stimuli. 

The work in this area has focused on a pseudo impulse response testing technique which makes use of digital hardware in the circuit to generate the test stimulus. 

The feasibility of the approach has been demonstrated by incorporating this scheme into an Engine Knock Detector circuit used in an automotive application.

This work is being carried out by Dr Gordon Russell, the principal researcher of SETNET and consultant to tCORE