We can provide a number of services in Semiconductor Test through the Semiconductor Test Network (SETNET) which we coordinate, and through our own consultants. We also have access to a state-of-art IMS mixed signal tester. 

In a number of projects we are looking at high temperature testing of semiconductors (up to 320 oC) using this instrument.

We are also involved in the development of BIST for high temperature SOI semiconductors.

Our services in semiconductor test include

  • device characterization
  • software development
  • first-silicon debug
  • test-bed for new techniques

along with consultancy in

  • built in self test (bist)
  • quiescent current monitoring
  • boundary scan
  • design for testability
  • asynchronous design and test
  • production test
  • memory test

We are not a high volume test house, but if you need specialist low to medium volume semiconductor test services or consultancy, particularly to support your design and research projects, then contact us and we will do our best to help.

 

 

- download info on the IMS tester

 

 

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tCORE Limited, Centre for Advanced Industry, Coble Dene, North Shields, NE26 6DE, United Kingdom

tel +44 (0)191 293 7112      fax +44 (0)191 293 7112    email info@tcore.co.uk