Test is a major feature of our activities at tCORE:

• We undertake testing of semiconductor components using an IMS mixed signal tester.

• We carry out special test of semiconductor components, such as electromigration testing.

• We test passive components

• We carry out failure analysis of components, boards and assemblies

• We develop specialist test systems

• We are involved in several research programmes developing novel ways of testing

Follow the links on the right for more details of our capabilities and case studies.